Editorial: Special issue on advances in zero defect manufacturing.
Daryl PowellMaria Chiara MagnaniniPublished in: Comput. Ind. (2023)
Keyphrases
- special issue
- international journal
- ai edam
- applied intelligence
- artificial intelligence
- ecml pkdd
- recent advances
- special section
- manufacturing processes
- quality control
- manufacturing systems
- defect detection
- manufacturing industry
- manufacturing enterprises
- machine learning
- process planning
- expert systems
- cell formation
- decision making
- information systems