Login / Signup

Reliability Assessment of Light-Emitting Diode Packages With Both Luminous Flux Response Surface Model and Spectral Power Distribution Method.

Wei ChenJiajie FanCheng QianBin PuXuejun FanGuoqi Zhang
Published in: IEEE Access (2019)
Keyphrases
  • surface model
  • prior knowledge
  • power distribution
  • machine learning
  • dynamic programming
  • image registration
  • reliability assessment
  • neural network
  • image data
  • fuzzy logic
  • input data
  • light emitting