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Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test.

Jean-Baptiste FonderLaetitia ChevalierCédric GenevoisOlivier LatryCedric DuperrierFarid TemcamaniHichame Maanane
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • quantitative analysis
  • real world
  • data analysis
  • statistical analysis
  • database
  • databases
  • neural network
  • genetic algorithm
  • computer vision
  • image analysis
  • test cases