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Module Grouping for Defect Tolerance in Nanoscale Memory.

Yoonjae HuhYoon-Hwa Choi
Published in: DFT (2008)
Keyphrases
  • memory requirements
  • grouping algorithm
  • memory capacity
  • evolutionary algorithm
  • main memory
  • memory usage
  • perceptual grouping
  • random access
  • memory space
  • defect detection
  • low memory
  • data sets
  • atomic force microscopy