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Module Grouping for Defect Tolerance in Nanoscale Memory.
Yoonjae Huh
Yoon-Hwa Choi
Published in:
DFT (2008)
Keyphrases
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memory requirements
grouping algorithm
memory capacity
evolutionary algorithm
main memory
memory usage
perceptual grouping
random access
memory space
defect detection
low memory
data sets
atomic force microscopy