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Impact of P-GaN ohmic Contact Resistivity on Switching Time of GaN Super-Heterojunction FETs.

Yuxin DuJesse T. KemmerlingJianan SongKeisuke ShinoharaVivek MehrotraRongming Chu
Published in: DRC (2024)
Keyphrases
  • structuring elements
  • neural network
  • gray scale
  • real time
  • data sets
  • three dimensional
  • face recognition
  • objective function
  • electric field
  • high impact