Login / Signup
Efficient combination of trace and scan signals for post silicon validation and debug.
Kanad Basu
Prabhat Mishra
Priyadarsan Patra
Published in:
ITC (2011)
Keyphrases
</>
high speed
computer vision
low cost
signal processing
expert systems
cost effective
databases
genetic algorithm
image processing
case study
multiresolution
silicon dioxide