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Efficient combination of trace and scan signals for post silicon validation and debug.

Kanad BasuPrabhat MishraPriyadarsan Patra
Published in: ITC (2011)
Keyphrases
  • high speed
  • computer vision
  • low cost
  • signal processing
  • expert systems
  • cost effective
  • databases
  • genetic algorithm
  • image processing
  • case study
  • multiresolution
  • silicon dioxide