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Cohomology of Cryo-Electron Microscopy.

Ke YeLek-Heng Lim
Published in: SIAM J. Appl. Algebra Geom. (2017)
Keyphrases
  • electron microscopy
  • x ray
  • low energy
  • image stacks
  • thin film
  • microscopy images
  • transmission electron microscopy
  • euler number
  • image segmentation
  • high level