A Thermal Quorum Sensing Scheme for Enhancement of Integrated-Circuit Reliability and Lifetime.

Hong-Hao Wang Po-Yao Chuang Cheng-Wen Wu

Published in: VLSI-DAT (2022)

Keyphrases

integrated circuit
image enhancement
distributed databases
real time
sensor networks
infrared
energy consumption
hardware description language
high resolution
low cost
massively parallel
printed circuit boards
life span