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Reducing test time for 3D-ICs by improved utilization of test elevators.

Sreenivaas S. MuthyalaNur A. Touba
Published in: VLSI-SoC (2014)
Keyphrases
  • data sets
  • test data
  • real time
  • decision making
  • probabilistic model
  • multiple choice
  • genetic algorithm
  • web services
  • image segmentation
  • multi agent
  • color images