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Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information.
Yuzo Takamatsu
Hiroshi Takahashi
Yoshinobu Higami
Takashi Aikyo
Koji Yamazaki
Published in:
IEICE Trans. Inf. Syst. (2008)
Keyphrases
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fault diagnosis
chemical process
real time
neural network
artificial intelligence
fuzzy logic
decision support system
logic programs
analog circuits