Design for Test of Asynchronous NULL Convention Logic (NCL) Circuits.
Waleed K. Al-AssadiSindhu KakarlaPublished in: J. Electron. Test. (2009)
Keyphrases
- built in self test
- high level synthesis
- logic synthesis
- delay insensitive
- digital circuits
- asynchronous circuits
- chip design
- neural network
- logic circuits
- shift register
- logic programming
- building blocks
- computer aided
- engineering design
- design space
- circuit design
- content analysis
- design process
- software engineering
- user interface
- e learning