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LW-YOLO: Lightweight Deep Learning Model for Fast and Precise Defect Detection in Printed Circuit Boards.
Zhaohui Yuan
Xiangyang Tang
Hao Ning
Zhengzhe Yang
Published in:
Symmetry (2024)
Keyphrases
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lightweight
deep learning
defect detection
probabilistic model
simulation model
printed circuit boards
image processing
higher order
unsupervised learning