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LW-YOLO: Lightweight Deep Learning Model for Fast and Precise Defect Detection in Printed Circuit Boards.

Zhaohui YuanXiangyang TangHao NingZhengzhe Yang
Published in: Symmetry (2024)
Keyphrases
  • lightweight
  • deep learning
  • defect detection
  • probabilistic model
  • simulation model
  • printed circuit boards
  • image processing
  • higher order
  • unsupervised learning