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Impact on circuit performance of deterministic within-die variation in nanoscale semiconductor manufacturing.
Munkang Choi
Linda S. Milor
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
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semiconductor manufacturing
process control
discrete event simulation
high speed
production system
databases
data sets
artificial intelligence
case study
expert systems
knowledge base
genetic algorithm
circuit design
high impact
analog circuits
machine learning
real time