Neural Networks for Defect Detection on Eddy-Currents-Based Non-Destructive Testing.
Diogo M. CaetanoLuis S. RosadoJorge R. FernandesSusana CardosoPublished in: SENSORS (2023)
Keyphrases
- defect detection
- neural network
- feature extraction
- pattern recognition
- fuzzy logic
- back propagation
- artificial neural networks
- automated visual inspection
- training process
- feed forward
- genetic algorithm
- multi layer
- self organizing maps
- flow field
- fuzzy systems
- activation function
- feedforward neural networks
- neural network is trained
- database