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Reliability analysis of MOS varactor in CMOS LC VCO.
Yidong Liu
Published in:
Microelectron. J. (2011)
Keyphrases
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reliability analysis
floating gate
flip flops
high speed
power consumption
analog vlsi
low cost
circuit design
power supply
low power
survival analysis
machine learning
fault tree
cmos technology
power dissipation
image sensor
artificial intelligence
condition monitoring
power plant
case based reasoning