Fast statistical analysis of RC nets subject to manufacturing variabilities.
Yu BiKees-Jan van der KolkJorge Fernandez VillenaLuís Miguel SilveiraNick van der MeijsPublished in: DATE (2011)
Keyphrases
- statistical analysis
- quality control
- manufacturing processes
- production planning
- statistical analyses
- statistical methods
- manufacturing systems
- production process
- manufacturing environment
- manufacturing industry
- floating point
- wafer fabrication
- concurrent engineering
- clinical data
- evolutionary algorithm
- decision trees
- decision making
- product design
- databases
- semiconductor manufacturing
- video sequences
- operations management
- information retrieval