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System Chip Test Challenges, Are There Solutions Today? (Panel).
Prab Varma
Published in:
DAC (1998)
Keyphrases
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optimal solution
low cost
high speed
key issues
lessons learned
real world
technical challenges
data sets
computational issues
practical solutions
infrared
case study
neural network
real time
test data
feasible solution
open issues
vlsi implementation
evolvable hardware