X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan.
Yingdi LiuSylwester MilewskiGrzegorz MrugalskiNilanjan MukherjeeJanusz RajskiJerzy TyszerBartosz WlodarczakPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2021)