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X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan.

Yingdi LiuSylwester MilewskiGrzegorz MrugalskiNilanjan MukherjeeJanusz RajskiJerzy TyszerBartosz Wlodarczak
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2021)
Keyphrases
  • data sets
  • databases
  • machine learning
  • case study
  • expert systems
  • wide range
  • pairwise