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A Novel Subpixel Industrial Chip Detection Method Based on the Dual-Edge Model for Surface Mount Equipment.

Weihua LiuYuanming ZhangXinghu Yu
Published in: IEEE Trans. Ind. Informatics (2023)
Keyphrases
  • detection method
  • detection algorithm
  • three dimensional
  • image sequences
  • probabilistic model
  • feature detection
  • particle filter