Chip clustering with mutual information on multiple clock tests and its application to yield tuning.
Jiun-Yi ChiangJun-Hua KuoTing-Shuo HsuJing-Jia LiouPublished in: ICCD (2014)
Keyphrases
- mutual information
- information theoretic
- high speed
- image registration
- clustering algorithm
- low cost
- criterion function
- physical design
- similarity measure
- k means
- unsupervised learning
- data mining
- medical image registration
- combining multiple
- information gain
- data clustering
- clustering method
- power consumption
- cluster analysis
- document clustering
- distance metric
- hierarchical clustering
- high dimensional data
- high density
- single chip
- image segmentation
- feature selection
- database
- similarity matrices
- information theoretic measures