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Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs.
Vinod Kumar Ancha
Fadi N. Sibai
Venkateswarlu Gonuguntla
Ramesh Vaddi
Published in:
IEEE Access (2024)
Keyphrases
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real world
defect detection
data sets
data mining
feature extraction
pattern recognition
probabilistic model
statistical models
neural network
wide range
real life
experimental data
image processing
image analysis
object oriented
computer graphics