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A gate delay model focusing on current fluctuation over wide-range of process and environmental variability.
Kenichi Shinkai
Masanori Hashimoto
Atsushi Kurokawa
Takao Onoye
Published in:
ICCAD (2006)
Keyphrases
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wide range
management system
formal model
mathematical model
objective function
computational model
process model
recognition process
information retrieval
prediction model
neural network model
conceptual model
experimental data
markov chain
probabilistic model
high level
genetic algorithm