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Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal.
Serkan Dusmez
Mehrdad Heydarzadeh
Mehrdad Nourani
Bilal Akin
Published in:
IEEE Trans. Ind. Informatics (2017)
Keyphrases
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outlier removal
surface reconstruction
infrared
power consumption
robust estimation
convex concave
object recognition
image data
markov random field
range images
range data
finite element analysis
robust regression