Defocusing image to pattern contact holes using attenuated phase shift masks.
Navab SinghMoitreyee Mukherjee-RoySohan Singh MehtaPublished in: Microelectron. J. (2003)
Keyphrases
- phase shift
- image data
- image analysis
- edge detection
- multiscale
- input image
- template matching
- low level
- single image
- image representation
- feature points
- image collections
- image content
- keypoints
- segmentation method
- image classification
- image features
- high resolution
- image retrieval
- image segmentation
- similarity measure
- image regions
- pixel values
- markov random field
- image pixels
- bounding box