Improved low-frequency noise for 0.3nm EOT thulium silicate interfacial layer.
Maryam OlyaeiB. Gunnar MalmEugenio Dentoni LittaPer-Erik HellströmMikael ÖstlingPublished in: ESSDERC (2014)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- transmission electron microscopy
- wavelet analysis
- subband
- low pass
- wavelet coefficients
- discrete wavelet transform
- original images
- frequency band
- low and high frequency
- electromagnetic fields
- high resolution
- high frequency components
- fusion rules
- feature vectors
- feature extraction
- wavelet domain
- power consumption
- motion estimation
- silicon dioxide