Login / Signup
An effective two-pattern test generator for Arithmetic BIST.
Ioannis Voyiatzis
Costas Efstathiou
Hera Antonopoulou
Athanasios Milidonis
Published in:
Comput. Electr. Eng. (2013)
Keyphrases
</>
pattern matching
artificial neural networks
neural network
computer vision
database systems
training data
multi agent
search algorithm
statistical tests
data generator