A fine pitch probe technology for VLSI wafer testing.

T. Tada R. Takagi S. Nakao M. Hyozo T. Arakawa K. Sawada M. Ueda

Published in: ITC (1990)

Keyphrases

data processing
cost effective
rapid development
technological advances
real world
databases
massively parallel
integrated circuit
personal computer
high speed
case study
website
neural network
signal processing
test data
multimedia
data sets
single chip
gate array