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Statistical Gate Sizing for Yield Enhancement at Post Layout Level.

Narender HanchateNagarajan Ranganathan
Published in: ISVLSI (2007)
Keyphrases
  • image enhancement
  • image processing
  • higher level
  • levels of abstraction
  • data mining
  • information theoretic
  • data sets
  • machine learning
  • information systems
  • image segmentation
  • database systems
  • evolutionary algorithm