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Material Classification from Time-of-Flight Distortions.
Kenichiro Tanaka
Yasuhiro Mukaigawa
Takuya Funatomi
Hiroyuki Kubo
Yasuyuki Matsushita
Yasushi Yagi
Published in:
IEEE Trans. Pattern Anal. Mach. Intell. (2019)
Keyphrases
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time of flight
infrared
depth information
high accuracy
tof camera
depth map
depth data
range data
spatial resolution
depth images
high resolution
stereo vision
real scenes
depth video
three dimensional
multispectral
viewpoint