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Optimized self-adapting contrast enhancement algorithm for wafer contour extraction.

Zhiyong YuJin WangGuodong Lu
Published in: Multim. Tools Appl. (2019)
Keyphrases
  • contour extraction
  • contrast enhancement
  • histogram equalization
  • computational complexity
  • viewpoint
  • multiscale
  • image data
  • segmentation algorithm