Microprocessor power noise measurements with different levels of resource occupancy.
Yoji BandoMakoto NagataPublished in: IEICE Electron. Express (2011)
Keyphrases
- measurement noise
- measurement errors
- measurement error
- high speed
- ibm power processor
- random noise
- resource allocation
- power consumption
- levels of abstraction
- signal to noise ratio
- noise level
- resource management
- design methodology
- high levels
- functional verification
- data sets
- noisy data
- missing data
- image noise
- measured data
- additive noise
- low power
- allocation scheme
- noise reduction
- memory subsystem
- silicon on insulator