FinFET-Based Flex-Vth SRAM Design for Drastic Standby-Leakage-Current Reduction.

Shin-ichi O'Uchi Meishoku Masahara Kazuhiko Endo Yongxun Liu Takashi Matsukawa Kunihiro Sakamoto Toshihiro Sekigawa Hanpei Koike Eiichi Suzuki

Published in: IEICE Trans. Electron. (2008)

Keyphrases