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AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs.

Sudarshan BahukudumbiSule OzevKrishnendu ChakrabartyVikram Iyengar
Published in: ASP-DAC (2007)
Keyphrases
  • maintenance cost
  • high speed
  • vlsi circuits
  • production cost
  • real time
  • defect detection