Error masking method based on the short-duration offline test.
Jan BelohoubekPetr FiserJan SchmidtPublished in: Microprocess. Microsystems (2017)
Keyphrases
- cost function
- preprocessing
- computational cost
- clustering method
- computational complexity
- high precision
- error rate
- experimental evaluation
- high accuracy
- detection algorithm
- theoretical analysis
- classification method
- detection method
- mutual information
- prior knowledge
- synthetic data
- average error
- error function
- error analysis
- statistical significance
- image retrieval
- test data
- cross validation
- image quality
- color images
- significant improvement
- probabilistic model
- optimization algorithm
- support vector machine svm
- objective function
- computationally efficient