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Guest Editors' Introduction.

Sybille HellebrandJörg HenkelAnand RaghunathanHans-Joachim Wunderlich
Published in: IEEE Embed. Syst. Lett. (2018)
Keyphrases
  • virtual machine
  • learning environment
  • computer vision
  • case study
  • three dimensional
  • high level
  • high quality
  • pattern recognition
  • image analysis
  • image registration
  • software engineering
  • data processing