Thermal expansion as a parameter for sensitivity analysis of waveguide filters.

Dmytro Farina Peter Hammes Stefan Reitzinger

Published in: Appl. Math. Comput. (2013)

Keyphrases

sensitivity analysis
waveguide
managerial insights
infrared
variational inequalities
influence diagrams
parameter values
edge detection
order statistics
frequency response
objective function
evolutionary algorithm
wavelet transform
thermal images
electro optic