Evaluation of test methods for silicon die strength.
Ming-Yi TsaiC. H. ChenPublished in: Microelectron. Reliab. (2008)
Keyphrases
- statistical tests
- significant improvement
- benchmark datasets
- gold standard
- preprocessing
- high speed
- classification method
- machine learning algorithms
- empirical studies
- evaluation methodology
- evaluation method
- statistically significant
- genetic algorithm
- artificial neural networks
- image processing
- information systems
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