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COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits.
Lakshmi N. Reddy
Irith Pomeranz
Sudhakar M. Reddy
Published in:
ICCAD (1992)
Keyphrases
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test set
test data
error rate
pattern matching
logic circuits
data sets
support vector
pattern recognition
active learning
classification accuracy
signal processing
image restoration
regular expressions