Criteria for analyzing high frequency testing performance of VLSI automatic test equipment.
Phil BurlisonPublished in: ITC (1990)
Keyphrases
- high frequency
- low frequency
- visual quality
- test cases
- high resolution
- wavelet transform
- test suite
- high frequencies
- wavelet coefficients
- subband
- discrete wavelet transform
- software testing
- low pass
- wavelet decomposition
- high frequency components
- frequency band
- multi resolution analysis
- high quality
- image data
- spatial resolution
- phase shifting
- machine learning