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Fine grain multi-VT co-integration methodology in UTBB FD-SOI technology.

Bertrand Pelloux-PrayerAlexandre ValentianBastien GiraudYvain ThonnartJean-Philippe NoelPhilippe FlatresseEdith Beigné
Published in: VLSI-SoC (2013)
Keyphrases
  • fine grain
  • coarse grain
  • data processing
  • parallel computation
  • distributed memory
  • silicon on insulator
  • database
  • real time