Login / Signup

On minimizing the number of test points needed to achieve complete robust path delay fault testability.

Prasanti UppaluriUwe SparmannIrith Pomeranz
Published in: VTS (1996)
Keyphrases
  • small number
  • computational complexity
  • test data
  • maximum number
  • real time
  • neural network
  • sensor networks
  • computationally efficient
  • power system
  • point sets
  • endpoints
  • single point
  • randomly distributed