Voltage Noise Induced DRAM Soft Error Reduction Technique for 3D-CPUs.

Tiantao Lu Caleb Serafy Zhiyuan Yang Ankur Srivastava

Published in: ISLPED (2016)

Keyphrases

error reduction
low voltage
classification error
classification accuracy
semi supervised
missing data
iterative learning
feature selection
noise reduction
significant improvement
main memory
parallel processing
noise level
data sets