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Incorporating Process Variations Into SRAM Electromigration Reliability Assessment Using Atomic Flux Divergence.
Zhong Guan
Malgorzata Marek-Sadowska
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
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reliability assessment
power consumption
decision trees
database systems
multiscale
search algorithm
control system
low power