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Incorporating Process Variations Into SRAM Electromigration Reliability Assessment Using Atomic Flux Divergence.

Zhong GuanMalgorzata Marek-Sadowska
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
  • reliability assessment
  • power consumption
  • decision trees
  • database systems
  • multiscale
  • search algorithm
  • control system
  • low power