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A test circuit for measurement of clocked storage element characteristics.
Nikola Nedovic
William W. Walker
Vojin G. Oklobdzija
Published in:
IEEE J. Solid State Circuits (2004)
Keyphrases
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high speed
low power
data storage
storage and retrieval
test cases
storage requirements
circuit design
neural network
information systems
expert systems
evolutionary algorithm
data management
test data
data acquisition