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C-Planarity Testing of Embedded Clustered Graphs with Bounded Dual Carving-Width.

Giordano Da LozzoDavid EppsteinMichael T. GoodrichSiddharth Gupta
Published in: IPEC (2019)
Keyphrases
  • graph matching
  • test data
  • graph theoretic
  • graph structure
  • graph representation
  • bounded treewidth
  • embedded systems
  • neural network
  • image sequences
  • digital images
  • test cases
  • graph theory
  • weighted graph