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Mask-ToF: Learning Microlens Masks for Flying Pixel Correction in Time-of-Flight Imaging.
Ilya Chugunov
Seung-Hwan Baek
Qiang Fu
Wolfgang Heidrich
Felix Heide
Published in:
CVPR (2021)
Keyphrases
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time of flight
learning algorithm
high resolution
depth map
infrared
image processing
image analysis
depth information
imaging sensors
tof camera
active learning
high accuracy
three dimensional
logistic regression
remote sensing
range data
depth images
decision trees
ccd camera