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Efficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper).

Farid N. NajmValeriy Sukharev
Published in: IRPS (2019)
Keyphrases
  • invited paper
  • physical models
  • power grids
  • experimental data
  • shape from shading
  • power grid
  • telecommunication systems
  • real time
  • information technology
  • long term
  • high speed