Formalized three-layer system-level model and reuse methodology for embedded data-dominated applications.
Frederik VermeulenFrancky CatthoorDiederik VerkestHugo De ManPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2000)
Keyphrases
- data sets
- experimental data
- input data
- test data
- probability distribution
- data structure
- prior knowledge
- database
- measured data
- multi layer
- formal model
- data collection
- synthetic data
- computational model
- data processing
- data points
- data sources
- training data
- simulation data
- spatial data
- statistical methods
- raw data
- data quality
- mathematical model
- process model
- management system
- data analysis
- high level
- databases
- statistical analysis
- image data
- end users
- neural network model
- image sequences
- learning models
- empirical data
- predictive model
- neural network