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Passivation and packaging of positive bevelled edge termination and related electrical stability.

Salvador HidalgoDavid FloresIsabel ObietaI. Mazarredo
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • positive and negative
  • high speed
  • closely related
  • high density
  • genetic algorithm
  • computer vision
  • design process
  • edge information
  • stability analysis
  • electronic circuits