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Test Cost Reduction for Performance Yield Recovery by Classification of Multiple-Clock Test Data.
Jun-Hua Kuo
Ting-Shuo Hsu
Jing-Jia Liou
Published in:
Asian Test Symposium (2012)
Keyphrases
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test data
cost reduction
test cases
training set
training data
training samples
test set
decision trees
training and test data
support vector
text classification
data sets
machine learning algorithms
base classifiers
feature space
model selection
active learning
data model
feature selection